Precision 28000 Test Subsystem
For the 28000 Signal Conditioner
Performance verification is a critical part of ensuring
data integrity of any measurement system.
On the New Frontiers of Precision
28000 Test Subsystem for the 28000 Signal Conditioner
A signal conditioner is a key component in the critical path of import ant test data, so its performance specifications must be rigorously proven and documented. At a minimum, yearly calibration helps to ensure defendable test data. But yearly calibration is costly, often requiring up to a month of downtime. And it's only the beginning. Making sure each channel works properly at test time means hours of tedious, difficult manual verification. The Precision 28000 self-test subsystem conducts rigorous yearly calibrations and quick Go/No-Go tests—all at the press of a button, and all without removing the system from the equipment rack.
and phase match are tested to original specifications. The Go/No-Go test does a quick check of the current programmed setup prior to an actual test to provide documented proof of system performance.
The same host computer controlling the 28000 system is used to control the test subsystem instruments. The GUI running on this computer controls all components necessary to run complete system tests. The 28000 channels are set to a desired test state, appropriate signal sources are selected, levels are programmed, and the multimeter (DMM) is read—all under computer control. One set of 28000-?-TEST test instruments can test multiple 28000 systems by daisy-chaining mainframes together. For traceability, the DMM is kept in calibration by a qualified metrology test lab.
28000 Test Subsystem Components
The test subsystem consists of the 28000 graphical user interface (GUI), the 28000-BIF-FT backplane interface (BIF) card with option F installed, and the 28000-?-TEST third-party test instruments, along with 28000 signal conditioning card-specific cables and adapters.
28000 Graphical User Interface
The GUI software running on the host computer controls the 28000-BIF-FT backplane interface card and 28000-?-TEST test instruments. The GUI provides the necessary software modules to perform tests on all supported 28000 conditioner cards.
28000-BIF-FT Backplane Interface Card
The 28000-BIF-FT card (BIF) with option F is installed in each 28000 chassis. The BIF supplies control to 28000 signal conditioning cards and provides the necessary hardware to interface between the test subsystem instruments and the 28000 system internal test and monitor busses.
28000-?-TEST Test Subsystem Instruments
The 28000-?-TEST test subsystem consists of third-party test instruments to provide signal sources and precise measurement capability. A Keysight 33509B function generator is used as the source of the test signals. The 28000-5-TEST provides a Keysight 34465A 6.5 digit multimeter (DMM) for measurement capability. The 28000-7-TEST supplies a precision 8.5 digit 3458A DMM, required to test 28000 cards with high DC precision. In addition, the 28000-?-TEST includes a kit for rack mounting and cables necessary to connect the instruments to the 28000 test and monitor busses.
System Features
System Benefits
Precision 28000 Test Subsystem
The 28000 test subsystem is a complete solution to performing both annual equipment calibrations and run-time performance verification. The 28000 test subsystem supports a suite of tests that run on the instrument right where it is, with no need to disassemble or move it. The tests check out all critical system specifications, are NIST traceable, and are the same manufacturing tests that are run at the factory.
The 28000 test subsystem provides three levels of test. Pretest Verify and Diagnostics are used to confirm that all elements of the test subsystem are functional. The Factory Acceptance Test (FAT) performs a complete parametric performance check of the signal conditioners. Parameters such as common mode rejection ratio noise, offset, gain, frequency response, amplitude match,
28000 Test Subsystem Description
Test Subsystem Control
The Precision 28000 test subsystem is controlled by a Windows host computer running the 28000 graphical user interface (GUI) software executable program. The GUI software controls the 28000-BIF-FT backplane interface card with option F and the 28000-?-TEST test instruments, typically over Ethernet. The BIF card provides communication and control support to the 28000 system and also contains the hardware interfaces to the 28000 test and monitor busses. Special hardware for test, such as synchronous detectors, amplifiers, attenuators, precise DC reference signals, and band-limiting noise filters are contained on the BIF in order to support the Factory Acceptance Test measurements.
The 28000 GUI FAT test selection panel allows the operator to select the channels and tests to perform on any hardware installed in the system. The GUI performs an inventory by model number and serial number of all equipment installed in the 28000 and includes this information in the reported test results. The model, serial, and trace numbers of the test instruments utilized are included in the test data files for traceability of the test data.
Levels of Tests
The 28000 test subsystem supports three levels of test:
The FAT is an extensive test routine designed specifically for each card. Every card function is exercised, and all data-critical performance characteristics are accurately measured and compared to published specifications. These calibration tests are the same rigorous measurement routines performed in the factory before shipment and are intended for periodic traceable calibration of the 28000 system. In addition, they may be used by the customer upon receipt and acceptance of new equipment.
For a quick check of the equipment before a test run, the Go/No-Go test measures system performance of the current programmed 28000 system setup.
The Pretest Verify and Diagnostics routine confirms calibration and traceability information of the DMM and performs a comprehensive check that all test subsystem components are functioning properly. Running this routine is recommended prior to any FAT or Go/No-Go testing.
Test data results are reported as a summary report for the system, a complete listing of test results for the system, and an individual test report for each tested card in the system. Test conditions, measurements, tolerances, and pass/fail status are reported for each of the hundreds of unique FAT tests that are performed per card. The test data header file contains a statement of uncertainty and test uncertainty ratio for the hardware that is tested.
Factory Acceptance Tests
The Factory Acceptance Test (FAT) is a full parametric test and is normally run at regular maintenance intervals. All programmable settings of the channel are measured and compared to original factory specifications. The system operator can specify which channels are tested and which individual tests to perform. Test results are saved as text report files on the host computer.
Test report files include:
Card FAT Tests
The Card FAT is a comprehensive set of Factory Acceptance Tests for signal conditioner cards. The user can select the channels to be tested and the tests to be performed.
FAT Tests Common to All Signal Conditioning Cards
Transducer Amplifier FAT Tests
Charge/IEPE FAT Tests
Thermocouple Amplifier Tests
Block Diagram of 28000 Test Subsystem.
*The 3458A DMM (part of the 28000-7-TEST) requires a GPIB connection. A USB/GPIB adapter is supplied with the 28000-7-TEST Test Subsystem.
The FAT test selection panel allows the user to select any tests to run on any set of channels. Test results can be saved to a file for later retrieval. A test summary is listed for quick diagnosis.
28000 Test Subsystem Description
Go/No-Go Tests
The Go/No-Go test provides a quick check of the system prior to taking data. Failed channels/cards are quickly identified so spares can be plugged in, minimizing system downtime.
The flexible Go/No-Go test routines allow you to select one or more tests (several tests are defined, including Filter, Gain, Offset, etc.), on one or more channels. The test confirms that the selected channel, or set of channels, is performing within specification of the selected test with the current channel setup.
The Go/No-Go tests include:
Pretest Verify and Diagnostics
The Pretest Verify and Diagnostics routine confirms that test system components are functional and is typically run before Factory Acceptance Tests and Go/No-Go tests.
The following components are verified:
FAT Tests for the Backplane Interface (BIF) Card
The BIF FAT test, for the 28000-BIF-FT card, tests all critical functions and programmable settings of the backplane interface card and functions of the test circuitry.
Selectable BIF FAT tests include:
Test Accessories
Monitor Bus and Test Bus Cables
Optional monitor bus and test bus cables are available to support additional cable length requirements and testing multi-chassis configurations.
Test Bus System Cables
Test bus system cables are coaxial BNC to BNC cables for connecting the 28000 front-panel TEST BUS connector and the Keysight 33509B function/waveform generator.
CB-BNC-24
24 inches (1 ea. included with 28000-?-TEST)
CB-BNC-48
48 inches
Test System Monitor Cables
Test system monitor cables are 9-pin D-shell to banana plug cables, with twisted shielded pair cable, for connecting the 28000 rear-panel SYSTEM MONITOR connector and the Keysight 34465A digital multimeter.
CB-DE9P/BAN-MONBUS-1.7
20 inches
CB-DE9P/BAN-MONBUS-4
48 inches (1 ea. included with 28000-?-TEST
Test System Monitor Cables for Multi-Chassis Tests
Test system monitor cables for multi-
chassis tests are 9-pin D-shell to 9-pin D-shell cables for daisy-chaining 28000 chassis using the additional SYSTEM MONITOR connectors on the rear of the chassis.
CB-DE9P/DE9D-2XMONBUS-1.7
20 inches
CB-DE9P/DE9D-2XMONBUS-4
48 inches
P8492 Rev D
Precision Filters, Inc.
240 Cherry Street
Ithaca, New York 14850
Telephone:607-277-3550
E-mail:pfinfo@pfinc.com
Web Site:www.pfinc.com
Ordering Guide
28000-5-TEST: Test subsystem w/ Keysite 34465A (6.5 digit DMM), 33509B function generator, cables and rack adapters
28000-7-TEST: Test subsystem w/ Keysite 3458A (8.5 digit DMM), 33509B function generator, cables and rack adapters
Test Adapter and Cable Requirements by 28000 Card Model |
|||||
Card Model |
M3 Chassis Reference Cable for Frequency Response Match |
M5 Chassis Reference Cable for Frequency Response Match |
Required Test Adapter(s) |
Test Adapter Function |
Notes |
28101 |
Match not supported |
Match not supported |
CB-28101-TEST |
Supports calibration of excitation supply |
6 |
28118 28108 |
CB-REF-C |
CB-HD26P-REF-C |
28108-TEST-ADAPTER |
Supports test for excitation sense, current limit, linearity under load |
1 |
28114 28144 28124 |
CB-REF-C |
CB-HD26P-REF-C |
28144-TEST-ADAPTER; 281X4-TEST-ADAPTER-34465A or 281X4-HC10-TEST-ADAPTER; 281X4-TEST-ADAPTER-34465A |
Bridge completion, shunt cal, excitation sense, current limit, linearity under load -- 28124-HC10-TEST-ADAPTER, for cards with HC10 configuration modules only |
1 1 |
28124-EA |
CB-REF-C |
CB-HD26P-REF-C |
28144-TEST-ADAPTER; 281X4-TEST-ADAPTER-3458A |
Bridge completion, shunt cal, excitation sense, current limit, linearity under load |
1, 6 |
28154 28164 |
Match not supported |
Match not supported |
28154-TEST-ADAPTER; CB-28154-TEST or 28154-HC10-TEST-ADAPTER; 28154-TEST-ADAPTER-34465A |
Bridge completion, shunt cal, excitation sense, current limit, linearity under load -- 28154-HC10-TEST-ADAPTER, for cards with HC10 configuration modules only |
1 1 |
28208A |
CB-REF-C |
CB-HD26P-REF-C |
Requires 28208A-1-ITB with CB-28208A-ITB to run FAT |
n/a |
6 |
28302B |
CB-REF-C |
CB-HD26P-REF-C |
28302B-CHARGE-ADAPTER |
Supports traceable calibration of internal shunt capacitor |
|
28304 28324 |
CB-REF-C |
CB-HD26P-REF-C |
28304/28324-FAT-ADAPTER; 28000-TEDS-ADAPTER-A |
Supports traceable calibration of internal shunt capacitor and optional TEDS functionality |
2, 3 |
28314 |
CB-REF-C |
CB-HD26P-REF-C |
28334A/28314-CHARGE- ADAPTER; 28000-TEDS-ADAPTER-A |
Supports traceable calibration of internal shunt capacitor and optional TEDS functionality |
3, 4 |
28316C |
CB-28316C-DC37P-REF-C |
CB-28316C-DC37P-REF-C |
28316B-TEST-ADAPTER-A or 28316B-IEPE-ADAPTER |
Required for IEPE current accuracy and optional TEDS functionality |
5 |
28458 |
CB-REF-C |
CB-HD26P-REF-C |
CB-28458-TEST |
Supports traceable calibration of internal reference resistor for excitation current measurements |
|
28524 |
CB-REF-C |
CB-HD26P-REF-C |
None |
n/a |
|
28618 28608B |
Match not supported |
Match not supported |
None |
n/a |
|
28612 |
Match not supported |
Match not supported |
None |
n/a |
|
28918A |
CB-REF-C |
CB-HD26P-REF-C |
28908/28918-TEST-ADAPTER |
Supports IEPE dither and sensor cal tests |
1 |
28000- OM-TEST |
n/a |
n/a |
Requires proper test cable for output adapter module to be tested. Consult factory. |
The test card occupies two slots of a 28000 chassis and interfaces to the 28000 test subsystem to provide automated testing of 28000 output adapter modules. |
28000-BIF-FT: 28000 backplane interface card with options FT for test subsystem hardware
28000 GUI: Included with 28000 system
Reference Cable for Match Testing: See table below
Card Specific Test Adapters: See table below
Notes 1: Minimum of two adapters required per system. Two adapters per card strongly recommended for test time reduction.
Notes 2: One 28304/28324-FAT-ADAPTER required per system.
Notes 3: One 28000-TEDS-ADAPTER-A required per system. Two adapters per card strongly recommended for test time reduction.
Notes 4: One 28334A/28314-CHARGE-ADAPTER required per system.
Notes 5: Select only one adapter. The 28316B-TEST-ADAPTER-A is required for units with the TEDS option. The 28316B-IEPE-ADAPTER is required for units without the TEDS option. Two adapters per card strongly recommended for test time reduction.
Notes 6: The 28000-7-TEST is required for this card model.
Precision 28000 Test Subsystem
for the 28000 Signal Conditioner